Join our live webinar to learn about the main failure mechanisms in semiconductor power devices and techniques for their analysis.


June 8, 2021


June 8, 2021



Power semiconductor devices and integrated sensors are used in many products with automotive and renewable energy applications. These are often used in harsh environmental conditions (elevated temperature, humidity, corrosive gases etc.), which lead to specific new failure modes, not known from typical low-voltage integrated circuits. This webinar offers examples of semiconductor device failure modes and corresponding analytical techniques, as well as examples of their application.

Webinar Agenda

During this webinar we will cover:

  • Challenges facing microelectronic components
  • The main failure modes – from the perspective of an analytical service provider
  • Chemical and analytical techniques to study failure modes including corrosion, migration issues and mobile ions
  • Application examples

The sessions will end with a Q&A with our expert.

Who should attend?

This webinar is aimed at professionals in the semiconductor device supply chain, such as those involved in Quality Assurance, Research & Development, and application specialists.


Gerald Dallmann, SGS Division Manager

Gerald has more than 40 years of experience in technical and management positions in the semiconductor industry, failure analysis, quality assurance and in providing analytical services to industrial customers. He holds a diploma in Semiconductor Physics and Microelectronics Technology.

Register Today

Session 1
Tuesday, June 8, 2021 >
10:00 am (GMT +1:00) Europe/Paris

Session 2
Tuesday, June 8, 2021 >
4:00 pm (GMT +1:00) Europe/Paris

Important – Companies in China should register here >

Can't make a live session?

Register now and receive a complimentary recording after the live event.

For more information, please contact:

Jojo Leung
Global Marketing Specialist
Connectivity & Products
t: +852 2204 8328