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Join our HALT and HASS workshop to learn about how these two procedures can help you reach your quality and reliability targets.

Starts

April 26, 2017, 09:00

Ends

April 26, 2017, 18:00

Location

Weilburg, Germany

Chip

Manufacturers of electronic components and products focus a lot of their effort on achieving high levels of quality and maximum product reliability. Our “HALT” and “HASS” workshop will show you how these two procedures can help you reach your quality and reliability targets.

The "Highly Accelerated Life Test" (HALT) and "Highly Accelerated Stress Screening" (HASS) are two very effective and relevant testing procedures with which developers and manufacturers of electronic components can find weaknesses in their products at an early stage - before a faulty product lands on the market. The tests provide information on the causes of failures and possible improvements.

Dr. Jochen Beier from SGS, in Munich, will describe, during our practical workshop in Weilburg, the basics of HALT and HASS and the objectives and advantages of both test procedures. Furthermore, Dr. Beier will show where the limits of these testing procedures lie.

Venue: Weilburg, Hessen in Germany

For further information or any requests regarding our services, please contact:

Dr Jochen Beier
Germany
t: +49 89 787475 320